Material Analysis Modulab XM MTS Materials Test System
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The latest generation ModuLab® XM MTS system is designed with modularity and flexibility in mind to allow for a wide range of applications. Purpose built for materials test research the ModuLab XM provides: • •High-performance impedance analysis throughout the entire frequency range and across all three modes of operation • •Multi-component system calibration for unrivaled measurement accuracy • •Market leading frequency range and resolution (1 in 65,000,000) for testing resonant materials • •Compatibility with highly efficient cryostats, high temperature furnaces, and sample holders • •Plug and play option modules and additional channels to minimize system down time • • The ModuLab XM is a modular system that can be configured for the following applications: • • Dielectric Materials - Ferro/piezoelectrics | MEMs | NEMs | multiferroics | polymers | solid oxides SOFC | ionic conductors | solid electrolytes, quantum dots • Electronic Materials - LED | LCD | OLED | MEMs | OPV | Si | DCCS | OFET | Ge | GaAs | Perovskite materials • • 129610A Cryostat System • Materials researchs often need to characterize the electrical performance of materials over a wide range of temperature, e.g. ionic conductors in solid oxide fuel cells, semiconductor and electronic materials, ceramic materials for aerospace applications... • Solartron Analytical's 129610A provides: • •Sample in static gas (no sample cracking) • •Very low cryogen usage (typically 250 ml/hr @ 77 k) • •Operation to 78k with LN2, 5K with LHe • •Switching between LHe/LN2 operation per experiment • • The Model 12962A sample holder is designed to allow accurate impedance tests of solid materials to be performed at room temperature. The sample holder comprises of two parallel electrodes, one of which is fixed in position and the other which can be moved into contact with the sample by adjustment of a micrometer. The sample holder makes use of guard ring and reference techniques in order to improve accuracy by reducing “fringing” effects at the edge of the sample. The standard electrode provided is 20mm diameter. • ModuLab XM is compatible with various configurable high temperature furnace systems for testing ionic conductors, solid oxides, and solid electrolytes. • For more information visit :https://www.ameteksi.com/products/mat...
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