How AFM Works 44 Scanning Kelvin Probe Microscopy SKPM

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In Scanning Kelvin Probe Microscopy (SKPM), the AFM operates in non-contact mode while a conductive cantilever, oscillated at its fundamental resonant frequency, laterally scans over the sample surface. The resulting electrostatic signal provides information related to surface potential and the capacitance gradient. The topographic data is taken by controlling the force between the tip and the sample. • Learn more at • http://www.parkafm.com/index.php/park...

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