ZEISS 3D Electron Microscopy for Materials Research

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ZEISS Crossbeam FIB-SEM and ORION NanoFab: Your tools for nanotomography, nanopatterning and nanofabrication. Highest throughput, highest 3D resolution and always a maximum of information from your samples. • Learn more about ZEISS electron microscopes: https://www.zeiss.com/microscopy/int/... • #ZEISS #ElectronMicroscopy #3DImaging

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